7:40 – 8:40

Registration and Breakfast

8:40 – 8:55

Opening remarks – PAINE 2022 Awards

General Chair and Program Chair

8:55 – 9:35

Keynote Talk I: The Future of Collaboration Across Boundaries in Microelectronics

Dr. Donna Joyce – Army

9:35 – 9:55

Break

9:55 – 10:15

Beware of Discarding Used SRAMs: Information is Stored Permanently for PCB-Level Hardware Trojan Detection using Capacitive Sensor

Joshua Hovanes -Auburn University

10:15 – 10:35

EM-Fault It Yourself: Building a Replicable EMFI Setup for Desktop and Server Hardware

Niclas Kuhnapfel – Technical University of Berlin

10:35 – 10:55

An End-to-End Marking Recognition System for PCB Optical Inspection

Shajib Ghosh – University of Florida

10:55 – 11:15

Break

11:15 – 11:35

Parts Management Guidance Advanced Packaged Electronics

Jeffrey Jarvis – Army DEVCOM AvMC Parts Reliability

11:35 – 11:55

Security assessment of non-volatile memories through direct binary data extraction

Liu Qing – Temasek Laboratories, Nanyang Technological University

11:55 – 13:30

Lunch and Exhibit

13:30 – 15:00

The Future of PAINE: The Next Decade of Physical Assurance

Speakers: Dr. Richard Ott – Air Force Research Laboratory, Nir Sever – ProteanTecs, Dr. Adam Kimura – Battelle Memorial Institute, Jasper Woudenberg – Riscure.

15:00 – 15:20

Break

17:40 – 19:30

Reception

7:40 – 8:40

Registration and Breakfast

8:40 – 9:20

Keynote Talk II: Elevating Chip Fabrication Variations to Security at Application Level

Dr. Gang Qu – NSF

9:20 – 9:40

Break

9:40 – 10:00

Automated Transfer Learning Model for Counterfeit IC Detection

Shajib Ghosh – University of Florida

10:00 – 10:20

Printed Circuit Board inspection: Fusion of Optical and X-rayimages (FOXi) for electronic components classification

Sebelan Danishvar – Brunel University

10:20 – 10:40

Automated Structure Matching of Printed Circuit Boards

Calvin Hirsch – Two Six Technologies

10:40 – 11:00

Break

11:00 – 11:20

Machine Vision based Total Assurance: Traceability and Conformance from wafer to package to PCB

Dr. Naresh Menon– Chromologic

11:20 – 11:40

Mixed Signal Approach to IP Protection and Obfuscation

Dr. Nima Maghari– University of Florida

11:40 – 12:00

Heterogeneous Integration Challenges and Opportunities in 5G / 6G era

Dr. Yong-Kyu Yoon – University of Florida

12:00 – 13:15

Lunch and Exhibit

13:15 – 14:45

Secure Packaging: Initiatives, Research, and Workforce Development

Panelists: Dr. Madhavan Swaminathan – Georgia Institute of Technology, Dr. Gang Qu – NSF, Peter O’Donnell – Army CCDC, Saverio Fazzari – Booz Allen Hamilton, Dr. Charlie Hudnall – The University of Southern Mississippi

14:45 – 15:15

Break

15:15 – 15:35

Modeling and Simulation of Cyber Physical Systems for Cybersecurity Research

Dr. Tommy Morris– University of Alabama in Huntsville

15:35 – 15:55

Hardware & Supply Chain Assurance: Challenges and Advantages of Automation

Beau Bakken – Caspia Technologies

15:55 – 16:15

Heterogeneous Integration / Challenges with CHIPS Act

Sultan Lilani – Integra Technologies

16:15 – 16:35

Break

16:35 – 16:55

Single Image Printed Circuit Board Functional Similarity Clustering using Vision Transformers

Dr. Alex Fafard – – Two Six Technologies

16:55 – 17:15

Timing Camouflage Enabled State Machine Obfuscation

Michaela Brunner – -Technical University of Munich

17:15 – 17:35

CBA Image Analysis: A Comparison Of Visible, Infrared & X-ray Wavelengths

Ben Malin – Brunel University London

7:20 – 8:20

Registration and Breakfast

8:20 – 8:40

Muli-Modal Non-Destructive Evaluation with Digital Tomosynthesis 3D X-ray to reduce counterfeit ingress and increase batch sampling via faster throughput

Andy Barnes – Adaptix Ltd

8:40 – 9:00

Accelerating High Resolution X-ray Tomography of Large PCBs

Jeff Gelb – Sigray, Inc.

9:00 – 9:20

Deeper Scan – A rapid solution for (counterfeit) device identification and the detection of device tampering, utilising X-ray imagery

Jay Richards – NWPRO

9:20 – 9:40

Break

9:40 – 10:00

Ferroelectric Materials: Enabling Programmable Process Control Monitors

Rashmi Jha – University of Cincinnati

10:00 – 10:20

Utilization of Impedance Disparity Incurred from Switching Activities to Monitor and Characterize Firmware Activities

Md Sadik Awal – Florida International University

10:20 – 10:40

Towards PCB Netlist Extraction from Multimodal Imagery

Anthony George – Battelle Memorial Institute

10:40 – 11:00

Break

11:00 – 11:20

Unsupervised Domain Adaptation with Histogram-gated Image Translation for Delayered IC Image Analysis

Yee-Yang Tee – Nanyang Technological University

11:20 – 11:40

Target preparation methodology for semi-invasive attacks on microcontrollers

Rodrigo Silva Lima – ALPhANOV – Mines Saint-Etienne

11:40 – 12:00

Automated Stitching of Noisy Scanning Electron Microscopy Images for Integrated Circuit Reverse Engineering

Michael Pucher – University of Vienna

12:00 – 12:20

VeriGene: A Tool for the Creation of DNA Representations for Hardware Security Analysis

Nicholas Haehn – University of Cincinnati

12:20 – 13:30

Lunch and “University Labs Virtual Tour”

University Participants: The University of Alabama in Huntsville, University of Florida, Nanyang Technological University – Singapore, Brunel university – London, North Carolina State University, Auburn University, Centre Microélectronique Provence – France

17:15 – 17:35

Lunch