Past Program Schedule

San Francisco, CA, USA

Time

June 24, 2018

8:00 – 8:10

Opening Remarks

Mark Tehranipoor (steering committee)

Invited Talk 1

(Session Chair: Navid Asadi)

8:10 – 8:40

Invited Talk – Securely Storing Chip ID during IC Fabrication

David K. Lam, Chairman and CEO, Multibeam Corporation

8:40 – 9:05

Invited Talk – Microscopy Challenges Encountered in Reverse Engineering Advanced Node Technology ICs

Brenda Prentizer, President and CEO, Nanospective

9:05 – 9:25

Break


Paper Session 1: Fault Injection

(Session Chair: Saverio Fazzari)

9:25 – 9:45

“Assessment of a Chip Backside Protection”

Elham Amini, A. Beyreuther, N. Herfurth, Bernd Szyszka, and Christian Boit – Technical, University of Berlin

9:45 – 10:05

“Design and Implementation of a Negative Voltage Fault Injection Attack Prototype”

Christian Kudera, Markus Kammerstetter, Markus Mullner, Daniel Burian, and Wolfgang Kastner, Trustworks KG – Techinical University of Wien

10:05 – 10:25

“Nanopyramid: An Optical Scrambler Against Backside Probing Attacks”

Haoting Shen, Navid Asadi, Domenic Forte, Mark Tehranipoor – University of Florida

10:25 – 10:45

Break


Invited Talk 2

(Session chair: Brian Cohen)

10:45 – 11:10

Invited Talk – Hardware Security Implications of Reliability, Remanence and Recovery in Embedded Memory

Sergei Skorogobatov University of Cambridge

11:10 – 11:35

Invited Talk – On the Impact of Reverse Engineering on Integrated Circuit Security

Oliver Thomas, Founder and CTO, Texplained

11:35 – 12:00

Invited Talk – Steps Toward Automated Deprocessing of Integrated Circuits

Ed Principe, President and CEO, Synchrotron Inc.

12:00 – 13:00

Lunch


13:00 – 14:10

Panel Discussion: “Crossroad Between Physical Inspection and Hardware Security”

Panelists: Saverio Fazzari, Ted Lundquist, Oliver Thomas, Domenic Forte
Moderator: Mark Tehranipoor

Paper Session 2: Physical Inspection

(Session chair: Walter Patrick Hays and Yousef Iskander)

14:10 – 14:30

“Large-Area Automated Layout Extraction Methodology for Full-IC Reverse Engineering”

Raul Quijada, Roger Dura,Jofre Pallarès, Xavier Formatjé, Salvador Hidalgo, Francisco Serra-Graells Instituto de Microelectrónica de Barcelona, IMB-CNM (CSIC) – Universitat Autònoma de Barcelona

14:30 – 14:50

“Computer Aided IC Reverse Engineering Methodology on the Basis of the TI DST80 Cryptographic Immobilizer Tag”

Markus Kammerstetter, Markus Muellner, Daniel Burian, Christian Kudera, and Wolfgang Kastner Trustworks KG – Techinical University of Wien

14:50 – 15:10

“Detecting Hardware Trojans Inserted by Untrusted Foundry using Physical Inspection and Advanced Image Processing Techniques”

Nidish Vashistha, M T Rahman, Haoting Shen, Damon L Woodard, Navid Asadi and Mark Tehranipoor– University of Florida

15:10 – 15:30

“The Past, Present, and Future of Physical Security Enclosures: From Battery-Backed Monitoring to PUF-Based Inherent Security and Beyond”

Johannes Obermaier, Vincent Immler – Fraunhofer Institute AISEC

15:30 – 16:00

Break


Invited Talk 3

(Session Chair: Adam Waite)

16:00 – 16:25

Invited Talk – Effective Reverse Engineering with Partial Information

Lisa Mcllrath, Senior Security Technical Lead, Draper

16:25 – 16:50

Invited Talk – How fast is imaging a full die…with the world’s fastest SEM?

Lorenz Lechner, Technical Lead, Zeiss

16:50 – 17:00

Concluding Remarks

Program and General Chair