11:45 – 12:00

Opening Remarks – PAINE Awards

General Chair and Program Chair

12:00 – 12:35

Keynote Talk I: Can Chips be Hardened Against Attacks During Physical Design?

Serge Leef – DARPA

12:35 – 12:45

Live Q&A

12:45 – 13:05

Computed Tomography Challenges of Inspection of Navy Electronics.

Kyle Stoll-Navy Crane

13:05 – 13:25

Advanced Digital Forensics Investigations: Toward Systematic Threat Hunting Incident Response

Dr. Amin Termeh Yousefi– Facebook

13:25 – 13:45

Surface and Subsurface Electrical Measurements Using Scanning Microwave Impedance Microscopy

Jeffrey Jarvis – Army DEVCOM AvMC Parts Reliability

13:45 – 14:00

Live Q&A

14:00 – 14:15

Facebook Break (Diamond Sponsor)

14:15 – 15:30

Secure Heterogeneous Packaging

Panelists: Dr. Darren Crum (Navy), Peter O Donnell (Army), Dan Toohey (Mercury), John Stephens (Raytheon), Brian Sapp (I3 Microsystems)
Moderator: Saverio Fazzari (Booz Allen Hamilton)

15:30 – 15:50

Preparation, Imaging, and Design Extraction of the Front-End-of-Line and Middle-of-Line in a 14 nm Node FinFET Device

Adam R. Waite– Battelle Memorial Institute

15:50 – 16:05

ViTaL: Verifying Trojan-Free Physical Layouts through Hardware Reverse Engineering

Matthias Ludwig – Infineon Technologies AG

16:05 – 16:20

Microelectronics Failure Prediction and Localization from Optical and Thermal Imagery

Md Alimoor Reza – Indiana University

16:20 – 16:35

Live Q&A

16:35 – 16:50

Visualizing Electromagnetic Fault Injection With Timing Sensors

Michael Paquette – MITRE

16:50 – 17:05

Wavelet Selection and Employment for Side-Channel Disassembly

Random Gwinn – Johns Hopkins University

17:05 – 17:20

Exposing Data Value On a Risc-V Based SoC

Ezinam Bertrand Talaki – CEA/LETI

17:20 – 17:35

Live Q&A

12:00 – 12:35

Keynote Talk II: Heteregenoues Packaging

John Oakley – Semiconductor Research Corporation

12:35 – 12:45

Live Q&A

12:45 – 13:05

E-beam Probing: A High-Resolution Technique to Read Volatile Logic and Memory Arrays on Advanced Technology Nodes

Jennifer Huening– Intel Corporation

13:05 – 13:25

Backside Integrated Circuit Magnetic Field Imaging with a Quantum Diamond

Microscope – MITRE

13:25 – 13:45

Defect Detection and Classification in PCB Manufacturing using Amazon Web Services

Elizabeth Samara, Prashanth Ganapathy – Amazon WebServices

13:45 – 14:00

Live Q&A

14:00 – 14:15

Allied Break – (Platinum Sponsor)

14:15 – 15:30

Advances in Analog Domain Security and IC Fingerprinting

Panelists: Dr. Norman Chang (Ansys), Doug Gardner (Analog Devices), Dr. Thomas Kent (Battelle)
Moderator:Dr. Richard Ott, AFRL

15:30 – 15:45

Deep Learning-Based Approaches for Text Recognition in PCB Optical Inspection: A Survey

Shajib Ghosh – University of Florida

15:45 – 16:00

ChangeChip: A Reference-Based Unsupervised Change Detection for PCB Defect Detection

Yehonatan Fridman – Israel Atomic Energy Commission

16:00 – 16:15

Automated Trace and Copper Plane Extraction of X-ray Tomography Imaged PCBs

Ulbert Botero – University of Florida

16:15 – 16:30

Live Q&A

16:30 – 16:45

Two-Photon Optical Beam Induced Current for Circuit Level Verification and Validation of a 130 nm Microelectronic Device

Jeffrey Simon – Battelle Memorial Institute

16:45 – 17:00

Bitstream Reverse Engineering of Microsemi’s VersaTile-based FPGAs

Yongseen Kim – Electronics and Telecommunications Research Institute, South Korea

17:00 – 17:15

Patchable Hardware Security Module (PHaSM) for Extending FPGA Root-of-Trust Capabilities

Christopher Sozio – NAVSEA Crane

17:15 – 17:30

Live Q&A

12:00 – 12:35

Keynote Talk III: SI Traceability for 5G Hardware Authentication

Dr. Paul Hale – National Institute of Standards and Technology

12:35 – 12:45

Live Q&A

12:45 – 13:05

The 7 Habits of Highly Effective Security-Aware Design Automation

Jason Fung – Intel Corporation

13:05 – 13:25

Automation for Hardware and Supply Chain Assurance

Beau Bakken – Caspia Technologies

13:25 – 13:45

Recent Advances in Circuit-level Techniques to Kill the EM Side Channel Leakage at Its Source

Dr. Shreyas Sen – Purdue University

13:45 – 14:00

Live Q&A

14:00 – 14:20

Gold Sponsors Break

14:20 – 14:35

Attacks and Countermeasures for Capacitive PUF-Based Security Enclosures

Kathrin Garb – Fraunhofer Institute AISEC

14:35 – 14:50

Aging Prediction of Integrated Circuits Using Ring Oscillators and Machine Learning

Korey Arvin –University of Cincinnati

14:50 – 15:05

Fuzzy Key Generator Design using ReRAM-Based Physically Unclonable Functions

Ashwija Reddy Korenda –Northern Arizona University

15:05 – 15:20

Live Q&A

15:20 – 15:35

CRESS: Framework for Vulnerability Assessment of Attack Scenarios in Hardware

Matthias Ludwig – Infineon Technologies AG

15:35 – 15:50

Surreptitiously Adding a Microcontroller to a Printed Circuit Board

Dr. Sam Russ – University of South Alabama

15:50 – 16:05

Detection of Anomalous Integrated Circuits Using a Cavity Resonator System With Machine Learning

Aditya Nechiyil – The Ohio State University

16:05 – 16:20

Live Q&A

16:20 – 16:35

Risk Mitigation in the Design of Complex Systems through PIV & V

Warren Savage – University of Maryland

16:35 – 16:50

Emulating Adversaries and Measuring Outcomes for Logic Locking

Dr. Ramesh Karri, Dr. Benjamin Tan – New York University

16:50 – 17:05

Red Teaming Whys and Hows: A Logic Obfuscation Perspective

Dr. Ankur Srivastava, Dr. Yuntao Liu – University of Maryland

17:05 – 17:20

Live Q&A

17:20 – 17:35

Closing Remarks

General Chair and Program Chair