PAINE 2025 Winners
Best Paper
Metaheuristic Color Scheme Strategies for Enhanced Visual Inspection of 3D IC Layouts
Jie Zhang, Zhansen Shi, Hanchen Wang, Zhuoyang Zhang, Lucas Lum, Quanhao Gan, Shaoyu Cai, Eng Tat Khoo, Yeow Kheng Lim | National University of Singapore
Best Lab Demo
Reliable and Assured Microelectronics Lab (RAMLAB)
Director: Dr. Biswajit Ray | Colorado State University
Best Poster
Towards Improving Side-Channel Analysis in FPGAs using the Hardware Response
Meghana Jain and Douglas Summerville | Binghamton University
ABOUT PAINE
Physical inspection of electronics has grown significantly over the past decade and is becoming a major focus for the chip designers, original equipment manufacturers, and system developers. The complex long life of the electronic devices coupled with their diverse applications is making them increasingly vulnerable to various forms of threats and inspection. Large industry and government efforts have been put in place across the globe to address related supply chain security problems to offer solutions, training, and services. The number of programs introduced by the US government has increased over the years to analyze and develop relevant solutions. Although much focus is given to the digital domain, physical assurance and inspection of electronics as well as physical fingerprinting based on analog parameters are rapidly providing opportunities for unique countermeasures.
PAINE conference provides a unique venue for all researchers and practitioners from academia, industry, and government to have productive dialog on such topics. Accepted papers will be submitted for inclusion into IEEE Xplore subject to meeting IEEE Xplore’s scope and quality requirements. PAINE covers the broad topic of hardware security and trust; example topics of interest include but are not limited to: